NI PXIe-6570

Semiconductor ATE-Class Digital on the Open PXI Platform PXI Digital Pattern Instruments deliver ATE-class digital to the industry-standard PXI platform for testing a broad range of RF and mixed-signal integrated circuits (ICs). The NI PXI platform and NI Semiconductor Test System (STS) are an ideal platform for characterization and production test of RF and mixed-signal ICs from RF front ends and power management ICs to transceivers and Internet of Things systems on chip with built-in connectivity and sensors.

Key Features:

Includes Digital Pattern Editor for pattern development and debugging, API support for LabVIEW and text-based languages, shipping examples, and detailed help files .

• 32-channel, 100 MHz vector rate with 39.0625 ps of edge placement resolution 
• Digital voltage -2 V to 6 V, and PPMU force voltage -2 V to 7 V 
• Up to 200 Mb/s data rate and 160 MHz clock generation 
• Combine multiple modules to create digital subsystems with up to 512 channels 
• Dedicated source, capture, and history memory resources for up to eight parallel test sites