Tektronix 80SSPAR

Features & Benefits

Quickly Obtain S-parameters using Your TDR Oscilloscope Differential, Single Ended, Mixed Mode; Insertion, Return Loss, Frequency-domain Crosstalk PCI Express, Serial ATA, HDMI, Infiniband, Gigabit Ethernet, Manufacturing, and Standard Compliance Testing including Eye Mask Tests Simplified Calibration Procedure Minimizes Human Errors and Makes Fixture De-embedding a Simple Task Intuitive, Easy, and Accurate for Serial Data, Gigabit Digital Design, and Signal Integrity Gain Insight into Interconnect Link Performance through Synthesized Eye Testing Apply Industry Standard (PRBS, CJTPAT, K28.5, HDMI, etc.) or User-specified Stress Patterns Model Effect of Transmitter and Receiver Equalization on Signal Impairment Simulate Real-World Signals through Jitter and Noise Insertion Measure Computed BER, Eye Opening, Jitter and Noise and do BER Mask Testing at Any Point Along the Data Link Easily Analyze Sources of Interconnect Jitter, Losses, Crosstalk, Reflections, and Ringing Analyze Interconnects Concurrently in Time and Frequency Domains Quickly Perform Interconnect Link Analysis and Ensure System-level Simulation Accuracy Obtain More Accurate Impedance and S-parameter Measurements Enhanced TDR Resolution using Industry-best TDR Performance and Z-Line Multi-reflection Impedance Deconvolution Algorithm Fast and Easy Package and PCB Trace Failure Location 50 ? Calibration Eliminates the Need for Time-consuming Normalization Automate your Manufacturing Test and R&D Measurements with Scripts and Programmatic Control Command-line Interface for Many Functions (S-parameters, Z-Line, Others) Efficiently Model PCBs, Flexboards, Connectors, Cables, Packages, and Sockets Topological and Behavioral, Measurement Based, Frequency Dependent, Exact SPICE Models Automatically Convert TDR/T or VNA Data into SPICE with MeasureXtractor; Model Passivity, Stability, Causality Guaranteed Optimized for use with DSA8300 Digital Serial Analyzer Sampling Oscilloscope with 80E10, 80E08, and 80E04 True Differential TDR Modules
  Applications High-speed PCB, Cable Assembly, Connector, and IC Package Testing Serial Data Network Analysis Compliance Test for SATA, PCI Express, FB-DIMM, HDMI, Fibre Channel, Ethernet, and Other Serial Data Standards Consumer Electronics Testing Communications Testing Computer Testing *1 Also compatible with DSA8200, TDS/CSA8200, TDS/CSA8000B, and TDS/CSA8000 sampling oscilloscopes.   Software for Efficient Evaluation of Gigabit Interconnect Links and Devices

As clock speeds and rise times of digital circuits increase, interconnect signal integrity dramatically affects digital system performance. Accurate and efficient analysis of the interconnects in time and frequency domains is critical to predict signal losses, jitter, crosstalk, reflections and ringing, digital bit errors, and eye-diagram degradation, and ensure reliable system operation.   IConnect® software is the efficient, easy to use, and cost-effective solution for measurement-based performance evaluation of gigabit interconnect links and devices, including signal integrity analysis, impedance, S-parameter, and eye-diagram tests and fault isolation. With the help of IConnect and the built-in IConnect Linear Simulator, you can complete interconnect analysis tasks in minutes instead of days, resulting in faster system design time and lower design costs.   The Easiest Way to Perform Interconnect S-parameter Measurements for Serial Data Network Analysis Applications

IConnect® S-parameters is the efficient and easy-to-use tool for digital designers, operating at gigabit speeds, to perform single-ended, differential, and mixed-mode S-parameter measurements of interconnects, measure insertion loss, return loss, and frequency-domain crosstalk, and conduct interconnect electrical standard compliance testing.   EFFICIENCY   Operating on the DSA8300 TDR platform, IConnect S-parameters is the most cost-effective and highest throughput approach for S-parameter measurements in digital design, signal integrity analysis, and interconnect compliance testing. It provides as much as a 50% cost savings compared to similar bandwidth VNAs, and dramatically speeds up measurements. You can also take advantage of the IConnect S-parameters command-line interface to add S-parameter measurements to the overall suite of manufacturing tests you perform using your TDR instrument.
CALIBRATION AND MEASUREMENT SIMPLICITY   The simplicity of S-parameter calibration using a reference (open, short, or through) and an optional 50 ? load make the measurement itself, fixture de-embedding, and moving the reference plane a snap. Calibration simplicity minimizes human errors during the measurement. Touchstone file format output enables easy S-parameter file sharing for further data analysis and simulations.   With the addition of the IConnect® S-parameter Wizard, calibration and acquisition of one to four-port single-ended and differential S-parameters is even easier. This “mini-application” guides the user through setup, calibration (including channel deskew) and acquisition of S-parameters and automatically generates Touchstone files for one or multiple DUTs.   PERFORMANCE   Tektronix offers several true differential TDR modules, which in combination with IConnect allow S-parameters measurements with up to –70 dB of dynamic range. This performance is suitable for serial data analysis, digital design, and signal integrity applications, resolving better than 1% (–40 dB) of crosstalk, and electrical compliance test masks that typically call for the measurements in the –10 to –30 dB range. The table below summarizes the performance characteristics of these true differential TDR modules. Adding a wider-bandwidth module on the receiver end (e.g., using an 80E09 as a receiver with an 80E10 as a stimulus) will ensure the highest bandwidth for insertion loss measurements.