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Schnelles Angebot: Tektronix 80E10B

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Tektronix 80E10B

Electrical Sampling Module; with TDR, with Remote Samplers, Dual Channel, 50 GHz

Modell

80E10B

Produktfamilie

Oscilloscopes & Logic Analyzers

Hersteller

Tektronix

Konfigurierte Modelle enthalten die folgenden Merkmale:

Oscilloscopes & Logic AnalyzersSampling Oscilloscopes20GHz <= 50GHz

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Produktübersicht

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Merkmal	Wert
High Frequency (range)	20GHz <= 50GHz

Produktübersicht

The DSA8300 Series Sampling Oscilloscope, when configured with one or more electrical sampling modules, provides complete test solutions for multi-channel, high-bandwidth electrical applications. This highly configurable solution is well suited for debugging, characterizing and analyzing components, modules and systems with signaling rates at 10, 40 and even 100 Gb/s.

The 80E00 family of electrical sampling modules provide a wide variety of capabilities, allowing the user to configure a test solution specifically adapted to their application.

The 80E10B, 80E08B, and 80E04 are dual-channel Time Domain Reflectometry (TDR) sampling modules, providing up to 12 ps incident and 15 ps reflected rise time in the 80E10B (18 ps incident in 80E08B and 23 ps incident in 80E04). Each channel of these modules can generate a fast step for use in TDR mode and the acquisition portion of the sampling module monitors the incident step and any reflected energy. The polarity of each channel's step can be selected independently. This allows for differential or common mode TDR or S-parameter testing of two coupled lines, in addition to the independent testing of isolated lines. The independent step generation for each channel allows true differential measurements, which ensures measurement accuracy for differential devices.

Key Features

Independent sampler deskew ensures easy fixture and probe de-embedding

Dual channel (except 80E11X1)

Precision Microwave Connectors (3.5 mm, 2.92 mm, 2.4 mm, and 1.85 mm)

Probe support

Key Performance Specifications

Up to 70 GHz bandwidth and 5 ps measured rise time (10-90%)

Lowest noise for analysis: 450 μVRMS at 60 GHz, 300 μVRMS at 30 GHz

15 ps reflected true differential fully integrated TDR rise time (12 ps incident) and feature resolution below 1 mm (TDR modules)

Efficient, accurate, easy to use, and cost-effective S-parameters up to 50 GHz

Remote samplers¹ enable location of sampler near DUT and ensure best signal fidelity

note: ¹ Integrated on 80E07B - 80E10B and optional on 80E03, 80E04, 80E11 and 80E11X1.

Applications

Impedance characterization and S-parameter measurements for serial data applications

Advanced jitter, noise, and BER analysis

Channel and eye-diagram simulation and measurement-based spice modeling

80E10B, 80E08B, and 80E04:

High-performance TDR/T measurements

Impedance profile, inductance, capacitance, and S-parameters

Transmission line quality, impedance, and crosstalk

True differential, common mode, and single-ended measurements

Efficient fault isolation

80E11, 80E11X1, 80E09B, 80E07B:

High-frequency, low-noise signal acquisition

Fast rise time measurements

Jitter analysis and waveform analysis

80E03, 80E03-NV:

Device characterization, transmission quality, waveform parameters

Low signal measurements

Specifications
Electrical Sampling Modules
Model Overview
Module	Application	Bandwidth¹	Channels	Input impedance	Input connector
80E11 80E11X1	High-frequency Low-noise Signal acquisition and jitter characterization	70/60/(40) GHz²	2/1	50 ±1.0 Ω	1.85 mm female
80E10B	True differential TDR S-parameters Fault isolation	50/40/(30) GHz²	2	50 ±1.0 Ω	1.85 mm female
80E09B	High-frequency Low-noise Signal acquisition and jitter characterization	60/40/(30) GHz²	2	50 ±1.0 Ω	1.85 mm female
80E08B	True differential TDR and S-parameters	30/(20) GHz²	2	50 ±1.0 Ω	2.92 mm female
80E07B	Optimal noise/performance trade-off for jitter characterization	30/(20) GHz²	2	50 ±1.0 Ω	2.92 mm female
80E04	TDR impedance and crosstalk characterization	20 GHz³	2	50 ±0.5 Ω	3.5 mm female
80E03 80E03-NV	Device characterization	20 GHz⁴	2	50 ±0.5 Ω	3.5 mm female

Notes:

¹ Normal text is warranted values. Values in parenthesis are typical (unwarranted) value to which the instrument will typically perform.

² User selectable.

³ Calculated from 0.35 bandwidth rise time product.

⁴ The 80E03 bandwidth is calculated from 0.35 bandwidth rise time product. The 80E03-NV bandwidth is directly verified.

Specifications
Electrical Sampling Modules
Model Overview
Models	Description
80E11	Dual channel, 70+ GHz sampling module
80E11X1	Single channel, 70+ GHz sampling module
80E10B	Dual-channel, 50 GHz true differential TDR sampling module with remote samplers
80E09B	Dual-channel, 60 GHz sampling module
80E08B	Dual-channel, 30 GHz true differential TDR sampling module with remote samplers
80E07B	Dual-channel, 30 GHz sampling module
80E04	Dual-channel, 20 GHz true differential TDR sampling module
80E03/80E03-NV	Dual-channel, 20 GHz sampling module ¹
Instrument Options
80E04 Opt. 09	Include two 80A09 EOS/ESD Protection Devices with the 80E04 module
Recommended Accessories
80E04UP Opt. 09	80E04 Upgrade kit; That provides two 80A09 EOS/ESD Protection Devices in a case that can hold an 80E04 module
015-1001-xx	2X attenuator (SMA Male-to-Female)
015-1002-xx	5X attenuator (SMA Male-to-Female)
011-0157-xx	Adapter; (2.4 mm male to 2.92 mm female – can also be used as 1.85 mm male to 2.92 mm female)
P8018	20 GHz single-ended TDR probe. 80A02 module (below) recommended for static
P80318	18 GHz differential TDR probe. 80A02 module (below) recommended for static protection of each channel of the sampling or TDR module
80A09	26 GHz ESD Protection Accessory
80A02	EOS/ESD isolation module (1 channel). P8018 or P80318 TDR probe (above) recommended
80X01	One-meter sampling module extender cable (for 80E11, 80E11X1, 80E04, 80E03, 80E03-NV)
80X02	Two-meter sampling module extender cable (for 80E11, 80E11X1, 80E04, 80E03, 80E03-NV)

Note:

¹ For the 80E03-NV, bandwidth is directly verified and the Calibration Certification Report includes test data on the module's bandwidth test results.

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