Tektronix DPOFL-DDR5SYS

The DDR (Dual Data Rate) is a dominant and fast-growing memory technology. It offers high data transfer rates required for virtually computing applications, from consumer products to the most powerful servers. The high speed of these signals requires high-performance measurement tools. The Tektronix TekExpress DDR Tx is an automated test application used to validate and debug the DDR5 designs of the DUT as per the JEDEC specifications. The solution enables you to achieve new levels of productivity, efficiency, and measurement reliability.

Key Features:

• Supports 52 measurements of DDR5 System Transmitter Tests as per DDR5 JEDEC specification:
  • 21 Clock measurements
  • 09 Write Burst measurements
  • 01 Write Data Eye measurement
  • 13 Read Burst measurements
  • 08 Command and Address measurements
• User-defined acquisition mode for Clock, Command Address, Data Strobe, and data for both Write and Read traffic (or bursts)
• De-embedding support for Clock, Command Address, Data Strobe, and data for both Write and Read traffic (or bursts)
• Number of UIs support for Clock and Read/Write data measurements
• Deploys DDR DFE standalone application, that can be launched from TekScope > Analyze > DDR DFE
• Support DFE for Write Data Eye measurements
• User-friendly measurement configurations
• Test report to reflect all the statistics of the measurement
• User can select the source and the channel in the acquisition panel
• Multiple Burst Detection Method supported - Read and Write, Write Only, Read Only, and Visual Search
• Diamond shape mask and margin analysis for Write Data Eye measurement

The Tektronix option DDR5SYS is compatible with the following Tektronix oscilloscope models: 

DPO71604SX 

DPO72304SX 

DPO73304SX 

MSO72304DX 

MSO72504DX 

MSO73304DX 

DPO72304DX 

DPO72504DX 

DPO73304DX