The SD20 is a single-channel, 20 GHz loopthrough sampling head designed for low-loss testing in applications such as microwave systems research and development, digital device characterization and high-speed digital communications circuit design. It provides an acquisition rise time of 17.5 ps with typically 750 MicroVRMS of noise (350 MicroV with smoothing) to ensure clean, undistorted signals.
The SD20 is nonterminated and keeps losses to a minimum by routing the signal of interest directly through the sampling head without the need of a power divider. The SD20 can also be used for customized TDR measurements of transmission lines and controlled impedance devices. An external signal generator may be used, instead of the SD24 step generator, to tailor the TDR stimulus to fit a particular situation. For instance, slower slew rates or higher amplitude may be utilized, or you may perform half-sine or impulse testing.
In digital communications, the SD20 is useful for viewing and triggering on the clock signal without the use of a power divider.
Specifications |
|
Digital Sampling Oscilloscope |
|
Model Overview |
|
Model | Description |
11801C | Digital Sampling Oscilloscope |
Included Accessories | User Manual
Programmer Manual
Service Manual
12in. SMA-SMA Cable
1 Wrist Strap
|
Sampling Head |
|
SD-14 | 3-GHz high-impedance (100 kilohm/0.475 pF) dual-channel probe sampler |
SD-20 | 20-GHz single-channel loop-through head |
SD-22 | 12.5-GHz dual-channel low-noise head |
SD-24 | 20-GHz dual-channel TDR/sampling head |
SD-26 | 20-GHz dual-channel sampling head |
SD-32 | 50-GHz, single-channel sampling head |
SD-42 | 6.4-GHz O/E converter (55-ps optical pulse response FWHM) |
SD-44 | 15-GHz O/E converter |
SD-51 | 20-GHz trigger head |
The 11801C Digital Sampling Oscilloscope offers the widest range of on-board measurement and waveform processing capabilities of any multi-Gigahertz scope. With excellent measurement repeatability, exceptional vertical resolution, and fast display update rate, the 11801C is a powerful measurement tool for semiconductor testing, TDR characterization of circuit boards, IC packages and cables, and high-speed digital data communications.
Key Features |
DC To 50-Ghz Bandwidth |
7-ps Rise Time |
Eight Channels, Expandable to 136 (with SM-11 multichannel units) |
High Resolution and Measurement Repeatability |
10-Femtosecond Sampling Interval (0.01 ps) |
Modular Architecture |
Dual-Timebase Allows Multiple Windows |
FFT |
Predefined Telecom Masks |
True Dual-Step Differential TDR |
Fully Automatic Jitter and Noise Measurements |
Automatic Statistical Measurements, Histograms, and Mask Testing |
Automatic Pulse Measurements with Statistics |
Comprehensive Waveform Processing |
Complete Programmability for ATE Applications |
Colour Display with Colour Grading |
Applications |
Semiconductor Test |
TDR Characterization |
High-Speed Digital |
Data Communication |
The modular microprocessor-based architecture of the 11801C not only allows you to select the right configuration for your application, but also allows expandability to meet your future measurement needs. The 11801C accepts up to 4 dual-channel sampling heads and can be expanded through the SM-11 Multichannel Units to 136 channels.
There are currently nine sampling heads to choose from:
Specifications |
|
Digital Sampling Oscilloscope |
|
Model Overview |
|
Model | Description |
11801C | Digital Sampling Oscilloscope |
Included Accessories | User Manual
Programmer Manual
Service Manual
12in. SMA-SMA Cable
1 Wrist Strap
|
Sampling Head |
|
SD-14 | 3-GHz high-impedance (100 kilohm/0.475 pF) dual-channel probe sampler |
SD-20 | 20-GHz single-channel loop-through head |
SD-22 | 12.5-GHz dual-channel low-noise head |
SD-24 | 20-GHz dual-channel TDR/sampling head |
SD-26 | 20-GHz dual-channel sampling head |
SD-32 | 50-GHz, single-channel sampling head |
SD-42 | 6.4-GHz O/E converter (55-ps optical pulse response FWHM) |
SD-44 | 15-GHz O/E converter |
SD-51 | 20-GHz trigger head |