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快速報價: Lecroy WAVEPULSER-40IX-BUNDLE
Lecroy WAVEPULSER-40IX-BUNDLE
High-speed Interconnect Analyzer Bundle
型號
WAVEPULSER-40IX-BUNDLE產品類別
Power Quality & Electrical Test製造商
Lecroy配置型號包含以下特性:
Power Quality & Electrical TestEMC Test Equipment配置
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WavePulser 40iX is the ideal single measurement tool for high-speed hardware designers and test engineers. Neither VNAs (the "gold standard" for microwave or narrow-band device measurements) or TDRs (the traditional measurement instrument of the signal integrity engineer) have all the necessary features and capabilities. WavePulser 40iX comes standard with a deep analysis toolbox specifically tailored for understanding high-speed interconnect characteristics. WavePulser 40iX is fast to calibrate and simple to use.
| KEY FEATURES |
| S-parameters DC to 40 GHz, single- and mixed-mode |
| Impedance Profile with <1 mm resolution, differential and common-mode |
| Internal, automatic OSLT calibration |
| USB-connected, small, lightweight |
| Flexible display of measurements |
| Remove effects of fixtures, connectors and cables |
| Emulate eye diagrams with CTLE, DFE, and FFE equalization |
| Advanced jitter analysis |
| BENEFITS | |
| Designed for High-speed Interconnect Analysis | WavePulser 40iX is designed specifically for high-speed interconnect analysis. It validates, debugs, and troubleshoots interconnectivity issues in serial-data cables, channels, connectors, vias, backplanes, printed-circuit boards, and chip and SoC packages. It is simple to set up and use. |
| Internal, Automatic Calibration | WavePulser 40iX calibration standards are built-in (included in the standard unit) and calbration is always automated, simple and fast — make one connection to the DUT and press Go. WavePulser 40iX does not require purchase of additional, external calibration standards. Furthermore, WavePulser 40iX's TDR/TDT-based approach is independent of setup, making calibration less likely. |
| Full-range DC to 40 GHz | With a bandwidth from DC to 40 GHz, WavePulser 40iX delivers TDR step response and time-gated and/or emulated physical-layer responses with no need for extrapolation to DC and low frequencies, which is ideal for interconnection systems. |
| SPECIFICATIONS | |||||
| WavePulser 40iX High-speed Interconnect Analyzer Overview | |||||
| Model | WavePulser Hardware Unit | Adapters and Calibration Kit | NRZ Serial Data Analysis | 1xShort/Open & 2XThru Advanced De-embedding | PAM Serial Data Analysis Analysis |
| WAVEPULSER-40IX | ✓ | x | X | X | X |
| WAVEPULSER-40IX-BUNDLE | ✓ | ✓ | ✓ | X | X |
| WAVEPULSER-SI-STUDIO-NRZ | X | X | ✓ | X | X |
| WAVEPULSER-SI-STUDIO-2XTHRU* | X | X | X | ✓ | X |
| WAVEPULSER-SI-STUDIO-PAM* | X | X | X | X | ✓ |
| WAVEPULSER-40iX-SI-KIT | X | ✓ | ✓ | X | X |
NOTE:
* Require WAVEPULSER-40IX-BUNDLE or WAVEPULSER-40IX-SI KIT or WAVEPULSER-SI-STUDIO-NRZ
| SPECIFICATIONS | |
| High-Speed Interconnect Analyzers | |
| Model / Product Code | Model / Product Description |
| WavePulser-40iX | High-speed Interconnect Analyzer |
| WavePulser-40iX-BUNDLE | High-speed Interconnect Analyzer & Accessories & NRZ HSSD Analysis |
| WAVEPULSER-SI-STUDIO-NRZ | NRZ Serial Data Analysis Framework, Eye, Jitter and Noise Measurements |
| WAVEPULSER-SI-STUDIO-2XTHRU | 1xShort/Open, 2XThru and 2XThru (Impedance Corrected) |
| WAVEPULSER-SI-STUDIO-UPG-PAM | PAM Serial Data Analysis Framework, Eye, Jitter and Noise Measurements |
| WAVEPULSER-40iX-SI-KIT | Adapters and Calibration Kit |
資源
文檔資料
Teledyne Lecroy WavePulser 40iX High-speed Interconnect Analyzer Data Sheet v09102025.pdf
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