Keithley 2510-AT
TEC Source Meter; Autotuning
Model
2510-ATProduct Family
LCR / Impedance AnalyzersManufacturer
KeithleyConfigured models contain the following attributes:
LCR / Impedance AnalyzersSemiconductor Test Equipment1MHz <= 10MHzConfigurations
Key Specs
Product Overview
Resources
Let us help you with your exact configuration
Please use 'Get Quick Quote' or ‘Configure Unit’ and we’ll contact you and quote for your exact need.
You can also get in touch, if you prefer, and our experts will be able to guide you with the right application and procurement solution for this product.
Key Specs
Indicates attributes available at part level. See Configurations tab for part detail.
| Attribute | Value |
|---|---|
| High Frequency (range) | 1MHz <= 10MHz |
Product Overview
The Models 2510 and 2510-AT TEC SourceMeter SMU instruments enhance Keithley’s CW (Continuous Wave) test solution for high speed LIV (light-current-voltage) testing of laser diode modules. These 50W bipolar instruments were developed in close cooperation with leading manufacturers of laser diode modules for fiberoptic telecommunications networks. Designed to ensure tight temperature control for the device under test, the Model 2510 was the first in a line of highly specialized instruments created for telecommunications laser diode testing. It brings together Keithley’s expertise in high speed DC sourcing and measurement with the ability to control the operation of a laser diode module’s Thermo-Electric Cooler or TEC (sometimes called a Peltier device) accurately.
The Model 2510-AT expands the capability of the Model 2510 by offering autotuning capability. P, I, and D (proportional, integral, and derivative) values for closed loop temperature control are determined by the instrument using a modified Zeigler-Nichols algorithm. This eliminates the need for users to determine the optimal values for these coefficients experimentally. In all other respects, the Model 2510 and Model 2510-AT provide exactly the same set of features and capabilities.
| Key Features |
| 50W TEC Controller combined with DC measurement functions |
| Fully digital P-I-D control |
| Autotuning capability for the thermal control loop (2510-AT) |
| Designed to control temperature during laser diode module testing |
| Wide temperature setpoint range (–50°C to +225°C) and high setpoint resolution (±0.001°C) and stability (±0.005°C) |
| Compatible with a variety of temperature sensor inputs— thermistors, RTDs, and IC sensors |
| Maintains constant temperature, current, voltage, and sensor resistance |
| AC Ohms measurement function verifies integrity of TEC |
| Measures and displays TEC parameters during the control cycle |
| 4-wire open/short lead detection for thermal feedback element |
| IEEE-488 and RS-232 interfaces |
| Compact, half-rack design |
| Specifications | |
| Keithley Optical SourceMeter Instruments | |
| Features | Benefits |
| Active temperature control | Prevents temperature variations that could cause the laser diode’s dominant output wavelength to change, leading to signal overlap and crosstalk problems. |
| 50W TEC Controller | Allows for higher testing speeds and a wider temperature setpoint range than other, lower-power solutions. |
| Fully digital P-I-D control | Provides greater temperature stability and can be easily upgraded with a simple firmware change. |
| Autotuning capability for the thermal control loop (2510-AT) | Eliminates the need to use trial-and-error experimentation to determine the best combination of P, I, and D coefficients. |
| Wide temperature setpoint range (–50°C to +225°C) and high setpoint resolution (±0.001°C) and stability (±0.005°C) | Covers most of the test requirements for production testing of cooled optical components and sub-assemblies. |
| Compatible with a variety of temperature sensor inputs—thermistors, RTDs, and IC sensors | Works with the types of temperature sensors most commonly used in a wide range of laser diode modules. |
| AC Ohms measurement function | Verifies the integrity of the TEC device. |
| 4-wire open/short lead detection for thermal feedback element | Eliminates lead resistance errors on the measured value, reducing the possibility of false failures or device damage. |
| Specifications | |
| Keithley Optical SourceMeter Instruments Overview | |
| Model | Description |
| Fiber Alignment Photodiode Meter 2502: | High speed analog output enables LIV testing at the fiber alignment stage. |
| 2520 Pulse Laser Diode Test System: | Synchronizing test system providing sourcing and measurement capability for pulsed and continuous LIV test. |
| TEC SourceMeter SMUs, 2510 and 2510-AT: | Ensure tight temperature control for laser diode modules by controlling its thermo-electric cooler. |
| Specifications | |||||
| Keithley Optical SourceMeter Instruments | |||||
| Model | Channels | Max Current Source/Measure Range | Max Voltage Source/Measure Range | Power | Measurement Resolution (Current / Voltage) |
| 2510 | 1 | 5A | 10V | 50 W | - |
| 2510-AT | 1 | 5A | 10V | 50 W | - |
| 2502 | 2 | 20mA | 100V | 2 W | 1fA |
| 2520 | 1 | 5A | 10V | 50 W | 700nA / 0.33mV |
| Specifications | |
| Keithley Optical SourceMeter Instruments | |
| Ordering Information | |
| Model | Description |
| 2510 | TEC SourceMeter |
| 2510-AT | Autotuning TEC SourceMeter SMU Instrument |
| Accessories Supplied: | User’s Manual Input/Output Connector |
Resources
File resources
Keithley Model 2510 & 2510-AT Data Sheet
Can't find what you are looking for?
Get in touch
